cross section sem image Search Results


argon ion beam  (Gatan Inc)
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Gatan Inc argon ion beam
Argon Ion Beam, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 94/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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cross-sectional sem images  (Carl Zeiss)
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Carl Zeiss cross-sectional sem images
Cross Sectional Sem Images, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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tem cross-sectional image  (Verlag GmbH)
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Verlag GmbH tem cross-sectional image
Tem Cross Sectional Image, supplied by Verlag GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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fib-sem cross-sectional images  (Edmund Optics)
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cross-sectional sem  (JEOL)
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JEOL cross-sectional sem
Cross Sectional Sem, supplied by JEOL, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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cathodoluminescence (cl) imaging in sem (sem-cl) on mechanically sectioned and polished samples of z systems  (Straumann GmbH)
90
Straumann GmbH cathodoluminescence (cl) imaging in sem (sem-cl) on mechanically sectioned and polished samples of z systems
Cathodoluminescence (Cl) Imaging In Sem (Sem Cl) On Mechanically Sectioned And Polished Samples Of Z Systems, supplied by Straumann GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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cross-sectional sem characterization of the lss  (Shenzhen Technology Co Ltd)
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Shenzhen Technology Co Ltd cross-sectional sem characterization of the lss
Cross Sectional Sem Characterization Of The Lss, supplied by Shenzhen Technology Co Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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cross-sectional tem images  (JEOL)
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JEOL cross-sectional tem images
Cross Sectional Tem Images, supplied by JEOL, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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fib cross-sectional sem imaging  (EAG Laboratories)
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EAG Laboratories fib cross-sectional sem imaging
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topographical and cross-section sem quanta 200 feg esem imaging  (Cressington Scientific Instruments)
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Topographical And Cross Section Sem Quanta 200 Feg Esem Imaging, supplied by Cressington Scientific Instruments, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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sem psi cross sections  (JEOL)
90
JEOL sem psi cross sections
( a ) The cross-sectional <t>SEM</t> image of a <t>BCAR-loaded</t> <t>PSi-A</t> sample and (in pink) the line used for the AES element profiles (before BCAR release). Scale bar: 30 mm. ( b ) AES elemental line profile along the pink line in the SEM image of this BCAR-loaded sample: red (O), purple (C), and brown (Si) of PSi. AES individual elemental mapping on the top side of PSi sample after releasing the BCAR: ( c ) oxygen, ( d ) silicon, and ( e ) carbon showing the presence of BCAR aggregates on the PSi surface (red and black color presents highest and lowest intensity of specific elements present respectively). ( f ) SEM image of top view of PSi. A scale bar of 60 µm applies to panels ( b – f ).
Sem Psi Cross Sections, supplied by JEOL, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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cross-sectional sem image of the lagp pellet coated with bi buffer  (Verlag GmbH)
90
Verlag GmbH cross-sectional sem image of the lagp pellet coated with bi buffer
( a ) The cross-sectional <t>SEM</t> image of a <t>BCAR-loaded</t> <t>PSi-A</t> sample and (in pink) the line used for the AES element profiles (before BCAR release). Scale bar: 30 mm. ( b ) AES elemental line profile along the pink line in the SEM image of this BCAR-loaded sample: red (O), purple (C), and brown (Si) of PSi. AES individual elemental mapping on the top side of PSi sample after releasing the BCAR: ( c ) oxygen, ( d ) silicon, and ( e ) carbon showing the presence of BCAR aggregates on the PSi surface (red and black color presents highest and lowest intensity of specific elements present respectively). ( f ) SEM image of top view of PSi. A scale bar of 60 µm applies to panels ( b – f ).
Cross Sectional Sem Image Of The Lagp Pellet Coated With Bi Buffer, supplied by Verlag GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Image Search Results


( a ) The cross-sectional SEM image of a BCAR-loaded PSi-A sample and (in pink) the line used for the AES element profiles (before BCAR release). Scale bar: 30 mm. ( b ) AES elemental line profile along the pink line in the SEM image of this BCAR-loaded sample: red (O), purple (C), and brown (Si) of PSi. AES individual elemental mapping on the top side of PSi sample after releasing the BCAR: ( c ) oxygen, ( d ) silicon, and ( e ) carbon showing the presence of BCAR aggregates on the PSi surface (red and black color presents highest and lowest intensity of specific elements present respectively). ( f ) SEM image of top view of PSi. A scale bar of 60 µm applies to panels ( b – f ).

Journal: Nanomaterials

Article Title: Surface Heterogeneous Nucleation-Mediated Release of Beta-Carotene from Porous Silicon

doi: 10.3390/nano10091659

Figure Lengend Snippet: ( a ) The cross-sectional SEM image of a BCAR-loaded PSi-A sample and (in pink) the line used for the AES element profiles (before BCAR release). Scale bar: 30 mm. ( b ) AES elemental line profile along the pink line in the SEM image of this BCAR-loaded sample: red (O), purple (C), and brown (Si) of PSi. AES individual elemental mapping on the top side of PSi sample after releasing the BCAR: ( c ) oxygen, ( d ) silicon, and ( e ) carbon showing the presence of BCAR aggregates on the PSi surface (red and black color presents highest and lowest intensity of specific elements present respectively). ( f ) SEM image of top view of PSi. A scale bar of 60 µm applies to panels ( b – f ).

Article Snippet: SEM PSi cross sections were acquired soon after the samples preparation (to avoid surface oxidation and the need to coat the sample with conductive layer) on a Jeol JMS 7401F SEM (Tokyo, Japan) at either 5 kV or 10 kV of beam energy.

Techniques: